Anti-Trip Technology for complete trip free Loop testing on all RCDs rated 30mA and above Anti-Trip Technology for complete trip free Loop testing on all RCDs rated 30mA and above Dual Display allows simultaneous measurements like Loop & PFC/PSC Two wire connection for Loop L-L, L-N and PSC testing is possible Phase rotation, Voltage and Frequency measurements Lock-down test button for 'hands free' testing with auto-start operation Display and front panel keyboards with Backlight to be visible in dark places Water and Dust proof (IP54) www.kew-ltd.co.jp/en/products/detail/00084/